DISEASE: Bacterial leaf spot
HOST: Larkspur
Infected leaflets with many purplish spots with necrotic centers.
Bacterial leaf spot | Larkspur
DISEASE: Bacterial leaf spot
HOST: Larkspur (Delphinium sp.)
PATHOGEN: Pseudomonas syringae pv. delphinii
SOURCE: R. Raabe
DISEASE: Bacterial scab
HOST: Beet
Bacterial scab of table beet.
Bacterial scab | Beet
DISEASE: Bacterial scab
HOST: Beet (Beta vulgaris var. conditiva)
PATHOGEN: Pantoea agglomerans pv. betae
SOURCE: T. Burr
DISEASE: Bacterial stem rot
HOST: Dieffenbachia
Dieffenbachia with rot and decay of stem and leaf tissues.
Bacterial stem rot | Dieffenbachia
DISEASE: Bacterial stem rot
HOST: Dieffenbachia (Dieffenbachia seguine)
PATHOGEN: Dickeya dieffenbachiae
PATHOGEN SYNONYM: Erwinia chrysanthemi pv. dieffenbachiae
SOURCE: A. Alvarez
DISEASE: Bacterial stem rot
HOST: Dieffenbachia
Dieffenbachia with wilted and rotted leaves.
Bacterial stem rot | Dieffenbachia
DISEASE: Bacterial stem rot
HOST: Dieffenbachia (Dieffenbachia seguine)
PATHOGEN: Dickeya dieffenbachiae
PATHOGEN SYNONYM: Erwinia chrysanthemi pv. dieffenbachiae
SOURCE: R. Raabe
DISEASE: Bacterial stem rot
HOST: Dieffenbachia
Cross section of stem exposing rotted tissues.
Bacterial stem rot | Dieffenbachia
DISEASE: Bacterial stem rot
HOST: Dieffenbachia (Dieffenbachia seguine)
PATHOGEN: Dickeya dieffenbachiae
PATHOGEN SYNONYM: Erwinia chrysanthemi pv. dieffenbachiae
SOURCE: R. Raabe
DISEASE: Bacterial stem rot
HOST: Dieffenbachia
Leaf with rot and wilt.
Bacterial stem rot | Dieffenbachia
DISEASE: Bacterial stem rot
HOST: Dieffenbachia (Dieffenbachia seguine)
PATHOGEN: Dickeya dieffenbachiae
PATHOGEN SYNONYM: Erwinia chrysanthemi pv. dieffenbachiae
SOURCE: R. Raabe
DISEASE: Larkspur virescence
HOST: Larkspur
Two diseased plants with stunted and small leaves, lack of flower coloration, and bunched flower buds. Healthy plant (left).
Larkspur virescence | Larkspur
DISEASE: Larkspur virescence
HOST: Larkspur (Delphinium sp.)
PATHOGEN: 'Candidatus Phytoplasma asteris'
PATHOGEN SYNONYM: Phytoplasma Aster yellows group
SOURCE: R. Raabe