DISEASE: Bacterial leaf scorch
HOST: Pecan
Pecan with necrotic scorched leaves with distinct dark lines between healthy and diseased tissues.

Bacterial leaf scorch | Pecan
DISEASE: Bacterial leaf scorch
HOST: Pecan (Carya illinoinensis)
PATHOGEN: Xylella fastidiosa
SOURCE: T. Brenneman
DISEASE: Bacterial leaf spot of beet
HOST: Beet
Beet leaves with spots and marginal necrosis.

Bacterial leaf spot of beet | Beet
DISEASE: Bacterial leaf spot of beet
HOST: Beet (Beta vulgaris subsp. vulgaris)
PATHOGEN: Pseudomonas syringae pv. aptata
PATHOGEN SYNONYM: Pseudomonas aptata
SOURCE: P. Brown
DISEASE: Bacterial leaf spot
HOST: Cabbage
Necrotic, light tan leaf spots, a late stage in disease development.

Bacterial leaf spot | Cabbage
DISEASE: Bacterial leaf spot
HOST: Cabbage (Brassica pekinensis)
PATHOGEN: Xanthomonas campestris pv. armoraciae
SOURCE: R. Campbell
DISEASE: Basal rot
HOST: Cabbage
Severe basal rot of Chinese cabbage.

Basal rot | Cabbage
DISEASE: Basal rot
HOST: Cabbage (Brassica pekinensis)
PATHOGEN: Pectobacterium carotovorum
PATHOGEN SYNONYM: Erwinia carotovora subsp. carotovora
SOURCE: Y. Sakamoto, M. Goto
DISEASE: Basal rot
HOST: Cabbage
Chinese cabbage with rotted base.

Basal rot | Cabbage
DISEASE: Basal rot
HOST: Cabbage (Brassica pekinensis)
PATHOGEN: Pectobacterium carotovorum
PATHOGEN SYNONYM: Erwinia carotovora subsp. carotovora
SOURCE: Y. Sakamoto, M. Goto
DISEASE: Bunch disease
HOST: Pecan
Pecan exhibiting bunch symptoms at ends of branches. This disease is thought to be caused by a phytoplasma similar to the walnut bunch pathogen in the X-disease group.

Bunch disease | Pecan
DISEASE: Bunch disease
HOST: Pecan (Carya illinoinensis)
PATHOGEN: 'Candidatus Phytoplasma pruni'
PATHOGEN SYNONYM: Phytoplasma X-disease group
SOURCE: W. Sinclair
DISEASE: Bunch disease
HOST: Pecan
Severe case of bunch disease. Note bunches of foliage.

Bunch disease | Pecan
DISEASE: Bunch disease
HOST: Pecan (Carya illinoinensis)
PATHOGEN: 'Candidatus Phytoplasma pruni'
PATHOGEN SYNONYM: Phytoplasma X-disease group
SOURCE: P. Bertrand