DISEASE: Goss's bacterial wilt and blight
HOST: Corn (Maize)
Wilted, dying plants. Leaves have gray to light yellow stripes and irregular margins that follow leaf veins. Systemically infected plants usually have orange vascular bundles.

Goss's bacterial wilt and blight | Corn (Maize)
DISEASE: Goss's bacterial wilt and blight
HOST: Corn (Maize) (Zea mays)
PATHOGEN: Clavibacter michiganensis subsp. nebraskensis
PATHOGEN SYNONYM: Corynebacterium nebraskense
SOURCE: A. Vidaver
DISEASE: Goss's bacterial wilt and blight
HOST: Corn (Maize)
The disease causes necrotic leaf lesions, which typically have dark flecks (freckles) within the lesions (not seen here).

Goss's bacterial wilt and blight | Corn (Maize)
DISEASE: Goss's bacterial wilt and blight
HOST: Corn (Maize) (Zea mays)
PATHOGEN: Clavibacter michiganensis subsp. nebraskensis
PATHOGEN SYNONYM: Corynebacterium nebraskense
SOURCE: A. Vidaver
DISEASE: Oleander leaf scorch
HOST: Oleander
Diseased plant with scalloped, yellowish leaves. This usually is followed by dieback of twigs and branches. Plants often die 2 years after infection.

Oleander leaf scorch | Oleander
DISEASE: Oleander leaf scorch
HOST: Oleander (Nerium oleander)
PATHOGEN: Xylella fastidiosa
SOURCE: S. Purcell
DISEASE: Oleander leaf scorch
HOST: Oleander
Oleander with symptoms of severe scorch.

Oleander leaf scorch | Oleander
DISEASE: Oleander leaf scorch
HOST: Oleander (Nerium oleander)
PATHOGEN: Xylella fastidiosa
SOURCE: M. Blua
DISEASE: Oleander leaf scorch
HOST: Oleander
Oleander with scorch symptoms primarily at leaf tips, an early stage of disease.

Oleander leaf scorch | Oleander
DISEASE: Oleander leaf scorch
HOST: Oleander (Nerium oleander)
PATHOGEN: Xylella fastidiosa
SOURCE: M. Blua
DISEASE: Sweet potato little leaf
HOST: Sweet potato
Infected plant (left) and healthy plant (right).

Sweet potato little leaf | Sweet potato
DISEASE: Sweet potato little leaf
HOST: Sweet potato (Ipomoea batatas)
PATHOGEN: 'Candidatus Phytoplasma aurantifolia'
PATHOGEN SYNONYM: Phytoplasma Peanut witches'-broom group
SOURCE: R. McCoy, M. Davis